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FSIM: A Feature Similarity Index for Image Quality Assessment

By: 
Dr. Lin Zhang

We propose a novel low-level feature similarity (FSIM) induced FR IQA metric, namely, FSIM. FSIM can measure image quality automatically and consistently with human perception.

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Recent Advances of Deep Learning within X-ray Security Imaging

By: 
Dr. Samet Akcay

This blog explores modern deep learning applications as well as traditional machine learning techniques for automated X-ray security imaging.

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Jan Allebach (Purdue University, USA)

Lecture Date: May 1, 2018
Chapter: Santa Clara Valley
Chapter Chair: Pavel Tcherniaev
Topic: Small, Medium, and Big Data: Application of Machine
Learning Methods to the Solution of
Real-World Imaging and Printing Problems

 

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