Learning from Imperfect Data (LID) challenge

You are here

Top Reasons to Join SPS Today!

1. IEEE Signal Processing Magazine
2. Signal Processing Digital Library*
3. Inside Signal Processing Newsletter
4. SPS Resource Center
5. Career advancement & recognition
6. Discounts on conferences and publications
7. Professional networking
8. Communities for students, young professionals, and women
9. Volunteer opportunities
10. Coming soon! PDH/CEU credits
Click here to learn more.

Learning from Imperfect Data (LID) challenge

2019

We will organize the first Learning from Imperfect Data (LID) challenge on object semantic segmentation and scene parsing, which includes two competition tracks:

Track1: Object semantic segmentation with image-level supervision

Track2: Scene parsing with point-based supervision

Technical Committee: Image, Video, and Multidimensional Signal Processing

SPS Social Media

IEEE SPS Educational Resources

IEEE SPS Resource Center

IEEE SPS YouTube Channel