big data

You are here

Top Reasons to Join SPS Today!

1. IEEE Signal Processing Magazine
2. Signal Processing Digital Library*
3. Inside Signal Processing Newsletter
4. SPS Resource Center
5. Career advancement & recognition
6. Discounts on conferences and publications
7. Professional networking
8. Communities for students, young professionals, and women
9. Volunteer opportunities
10. Coming soon! PDH/CEU credits
Click here to learn more.

big data

Recent Advances of Deep Learning within X-ray Security Imaging

By: 
Dr. Samet Akcay

This blog explores modern deep learning applications as well as traditional machine learning techniques for automated X-ray security imaging.

Full Story

Jan Allebach (Purdue University, USA)

Lecture Date: May 1, 2018
Chapter: Santa Clara Valley
Chapter Chair: Pavel Tcherniaev
Topic: Small, Medium, and Big Data: Application of Machine
Learning Methods to the Solution of
Real-World Imaging and Printing Problems

 

SPS Social Media

IEEE SPS Educational Resources

IEEE SPS Resource Center

IEEE SPS YouTube Channel