Machine Learning in Wavelet Domain for Electromagnetic Emission Based Malware Analysis
This paper presents a signal processing and machine learning (ML) based methodology to leverage Electromagnetic (EM) emissions from an embedded device to remotely detect a malicious application running on the device and classify the application into a malware family. We develop Fast Fourier Transform (FFT) based feature extraction followed by Support Vector Machine (SVM) and Random Forest (RF) based ML models to detect a malware.