IEEE Women in Engineering News: Registration Open for 2016 WIE-ILC, Awards Program
IEEE Women in Engineering (WIE) is pleased to announce upcoming events and opportunities: International Leadership Conference - Registration Open …
Read moreReminder call for Nominations: IEEE Fellow Class of 2017: Deadline 1 March
The nomination period for the 2017 Fellow Class is open and will continue through 1 March 2016. Visit the Fellow web page for nominee eligibility…
Read moreReminder Call for Nominations: IEEE Technical Field Awards: Deadline 31 January
Nominations are due 31 January annually for the IEEE Technical Field Awards (TFAs).
Read more2015 Annual Reporting and Rebate Requirements: Due 15 March
All Section officers and Chapter/Affinity Group chairs will be contacted with a reminder that the following annual reports are required to be…
Read more52 SPS Members Elevated to Fellow
Each year, the IEEE Board of Directors confers the grade of Fellow on up to one-tenth of one percent of the members. To qualify for consideration, an…
Read moreCall for Nominations: IEEE Signal Processing Letters Editor-in-Chief
The IEEE Signal Processing Society (SPS) invites nominations for the position of Editor-in-Chief for the following journal: IEEE Signal Processing…
Read moreCall for Proposals: GlobalSIP 2017
The IEEE Signal Processing Society (SPS) is accepting proposals from Regions 1-6 (USA) or 7 (Canada) for the 2017 IEEE Global Conference on Signal…
Read moreThe World's First Visual Innovation Award at ICIP 2016
In 2016, ICIP will for the first time feature a Visual Innovation Award. This Award was created to recognize pioneers of transformative technologies…
Read morePost-doc position in signal processing at Technion
Post-doc position in signal processing at the Technion – Israel Institute of Technology Position description: The department of Electrical…
Read moreIEEE BMC Newsletter – November 2015
The IEEE Biometrics Council reports on a cloud-based multi-biometric service, the development of the iris recognition market and biometric…
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