From the Editor

In my September editorial [1], I outlined the important components of good feature articles in response to feedback from our recent IEEE Periodicals Review and Advisory Committee (PRAC) meeting. In this issue's editorial, I discuss the process of organizing a special issue (SI) for IEEE Signal Processing Magazine (SPM). 

One of the main items of feedback during our recent IEEE Periodicals Review and Advisory Committee (PRAC) meeting was that IEEE Signal Processing Magazine (SPM) rejected too many feature article white papers as being “out of scope.” In this editorial, I attempt to outline the key features of a good feature article. 

The cellular industry has just reached another milestone with the development of 5G wireless communication technology. While research in 5G is a core part of the Signal Processing for Communications and Networking (SPCOM) technical committee, it may also be found in several other technical areas. 

There have been three key revolutions in the way that research has become accessible: publishing, code, and data. The second and third revolutions are still taking place, particularly driven by the rise of machine-learning and artificial intelligence research in the last decade. When I started my research career in 1995, the World Wide Web was still in its infancy. 

I just got back from the 2018 International Conference on Acoustics, Speech, and Signal Processing in Calgary, Alberta, Canada. One of the highlights for me as editor-in-chief (EIC) of IEEE Signal Processing Magazine (SPM) is SPM’s editorial board meeting.

Industry involvement is a significant area of interest for the IEEE Signal Processing Society (SPS). It is also a frequent topic of conversation at the SPS Board of Governors meetings. According to the SPS’s website (https:// signalprocessingsociety.org), 42% of our 19,000 members are from industry. Yet the number of attendees from industry of our flagship conference, the IEEE International Conference on Acoustics, Speech, and Signal Processing, is much lower, based on my best estimate from the sessions I attended.