Skip to main content

July 2026

Volume 43 | Issue 4

Issue Title
July 2026

Missing Data in Signal Processing and Machine Learning: Models, methods, and modern approaches

The goal of this paper is to provide an overview of recent methods for handling missing data in signal processing methods, from their origins to the challenges ahead. Missing data approaches are grouped by three main categories: i) missing-data imputation, ii) estimation with missing values and iii) prediction with missing values. We focus on methodological and experimental results through specific case studies on real-world applications. Promising and future research directions, including a better integration of informative missingness, are also discussed. We believe that the proposed conceptual framework and the presentation of the main problems related to missing data will encourage researchers of the signal processing community to develop original methods for handling missing values and to deal with new applications involving missing data in an adequate manner.

Read more

From Discovery to Deployment: Building Bridges Across the Signal Processing Community [From the Editor]

In this issue, alongside a feature article on missing data that inspired the cover, we present several other timely contributions, including our first article in a series highlighting standards activities in our field. This two-part article [A1, A2] describes the technical leadership of the IEEE Signal Processing Society Synthetic Aperture Standards Committee (SPS-SASC) and its working groups in developing standards for the rapidly evolving field of computational imaging and sensing. This marks the first standards initiative led by the IEEE Signal Processing Society in partnership with the IEEE Standards Association. Thanks to the dedicated leadership of Peter Vouras and the commitment of many volunteers, SPS-SASC has grown into a vibrant standards committee with 14 working groups in less than five years, with the standard on sonar imaging now approaching publication.

Read more