The technology we use, and even rely on, in our everyday lives –computers, radios, video, cell phones – is enabled by signal processing. Learn More »
1. IEEE Signal Processing Magazine
2. Signal Processing Digital Library*
3. Inside Signal Processing Newsletter
4. SPS Resource Center
5. Career advancement & recognition
6. Discounts on conferences and publications
7. Professional networking
8. Communities for students, young professionals, and women
9. Volunteer opportunities
10. Coming soon! PDH/CEU credits
Click here to learn more.
Despite the impressive technological strides made over the years, human lives still depend very much on the natural environment. Fortunately, technology can now be used to help address critical environmental concerns in air quality, soil condition, and weather events. In all of these areas and many others, signal processing is supporting the ability to provide immediate and long-term observations and insights.
It’s generally accepted that the efficient monitoring of airborne particulate matter (PM), particularly particles with an aerodynamic diameter measuring less than 2.5 μm (PM2.5), is an important step toward sustaining and improving public health.
Acknowledging this fact, researchers at the Max Planck Institute for the Science of Light have developed a novel way to continuously monitor a local environment for both the size and optical properties of individual airborne particles. The technique utilizes optical forces to automatically capture airborne particles and then propel them into a hollow-core fiber where they can be studied and counted, providing a potentially better way to monitor air pollution levels.
On-the-fly particle metrology uses both advanced optics and signal processing to continuously monitor the size and refractive index of individual airborne particles in an open atmosphere, says research team leader Shangran Xie (Figure 1). “It can overcome several limitations of … existing methods, offering the ability of simultaneous measurement of particle size and refractive index, which can assist in identifying particle material, real-time particle metrology, highly reproducible results, and unlimited device lifetime,” he explains.
Home | Sitemap | Contact | Accessibility | Nondiscrimination Policy | IEEE Ethics Reporting | IEEE Privacy Policy | Terms | Feedback
© Copyright 2024 IEEE – All rights reserved. Use of this website signifies your agreement to the IEEE Terms and Conditions.
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.