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NEWS AND RESOURCES FOR MEMBERS OF THE IEEE SIGNAL PROCESSING SOCIETY

Postdoc in Forensic Science Program at Penn State University

The Forensic Science program at Penn State has an opening for a researcher to work on an NIJ-sponsored fingerprint statistics project. The project goals include (a) extracting and modeling the distribution of various features of finger impressions left by offenders at crime scenes and (b) correlating these quantitative measurements with conclusions reached by fingerprint practitioners. This project is at the crossroad between science and practice and is run in collaboration with international academics and U.S. forensic practitioners. It is designed to answer the concerns expressed by the National Academy of Sciences on the state of Forensic Science in the United States. The successful candidate will be responsible for modeling multi-dimensional distribution of fingerprint features, optimizing and testing these models on large sets of fingerprint data, and studying the correlation between decisions made by fingerprint examiners and probabilities assigned based on the models. Applications with Ph.D. in applied statisticians, applied mathematicians, signal processing engineers and related fields will be considered. Researchers having successfully met all requirements for the Ph.D. from their institution in the fields listed above, and awaiting the next commencement, will also be considered. Experience with programming languages such as C/C++, Java, or similar, is required; experience with R or Matlab is preferred. To apply: Applicants should submit a brief letter of application, a curriculum vitae, and arrange to have three letters of recommendation sent to: Prof. Cedric Neumann, 107 Whitmore Laboratory, University Park, PA 16802. Electronic submission of application materials is preferred. For submission and additional information, please send e-mails to czn2@psu.edu.  Penn State is committed to affirmative action, equal opportunity and the diversity of its workforce. (Source: Information from IEEE Jobsite)