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Editorial Board

Zhi Tian Editor-in-Chief:
Zhi Tian
George Mason University
Fairfax, VA, USA
Email EiC
Email SPS Publications Office
Term Ends: 31 December 2026

 

Deputy Editors-in-Chief

Name Affiliation
Gonzalo Mateos University of Rochester, USA
Gerald Matz Vienna University of Technology, Austria

Senior Area Editors

Name Affiliation
Alexander Bertrand KU Leuven, Belgium
Joseph Cavallaro Rice University, USA
Tsung-Hui Chang The Chinese University of Hong Kong, China
Subhro Das IBM Research, USA
André de Almeida Federal University of Ceara, Brazil
Paolo Di Lorenzo Sapienza University of Rome, Italy
Nicolas Dobigeon University of Toulouse, France
Min Dong Ontario Tech University, Canada
Nicolas Gillis University of Mons, Belgium
Y.-W. Peter Hong National Tsing Hua University, Taiwan
Usman A. Khan Tufts University, USA
Sangarapillai Lambotharan Loughborough University, United Kingdom
Antonio Marques King Juan Carlos University, Spain
Kumar Vijay Mishra The University of Maryland, USA
David Morales-Jimenez University of Granada, Spain
Ketan Rajawat Indian Institute of Technology Kanpur, India
David Ramirez Universidad Carlos III de Madrid, Spain
Florian Römer Fraunhofer Institute for Nondestructive Testing IZFP, Germany
Joseph Tabrikian Ben-Gurion University of the Negev, Israel
Ali Tajer Rensselaer Polytechnic Institute, USA
Vincent Tan National University of Singapore, Singapore
Bo Tang National University of Defense Technology, China
Pascal Vallet Bordeaux INP, France
Luca Venturino University of Cassino and Southern Lazio (UNICAS), Italy
Ba-Ngu Vo Curtin University, Australia
Hsiao-Chun Wu Louisiana State University, USA
Yik-Chung Wu The University of Hong Kong, Hong Kong
Masahiro Yukawa Keio University, Japan
Yimin Zhang Temple University, United States

Associate Editors

Name Affiliation
George Atia University of Central Florida, USA
Behtash Babadi University of Maryland, USA
Juan Andres Bazerque University of Pittsburgh, USA
Andreas Burg Ecole Polytechnique Federale de Lausanne (EPFL), Switzerland
Renato Luis Garrido Cavalcante Fraunhofer Heinrich Hertz Institute, Germany
Pin-Yu Chen IBM, USA
Tianyi Chen Rensselaer Polytechnic Institute, USA
Kobi Cohen Ben-Gurion University of the Negev, Israel
Laurent Condat King Abdullah University of Science and Technology (KAUST), Saudi Arabia
Rodrigo de Lamare University of York, UK
Mohammed Nabil El Korso Paris Saclay University, France
Gabriel Falcao IT, University of Coimbra, Portugal
Xiao Fu Oregon State University, USA
Emanuele Grossi Università degli Studi di Cassino e del Lazio Meridionale (UNICAS), Italy
Yujie Gu Aptiv, USA
Qinghua Guo University of Wollongong, Australia
Mingyi Hong University of Minnesota, USA
Yongwei Huang Guangdong University of Technology, China
Yuan-Hao Huang National Tsing Hua University (NTHU), Taiwan
Elvin Isufi Delft University of Technology, Netherlands
Che Lin National Taiwan University, Taiwan
Qing Ling Sun Yat-Sen University, China
Sijia Liu Michigan State University, USA
Ya-Feng Liu Chinese Academy of Sciences, China
Florian Meyer University of California, USA
João F. C. Mota Heriot-Watt University, UK
Thomas Oberlin University of Toulouse, France
Samet Oymak University of California, USA
Piya Pal University of California, USA
Yanning Shen University of California, USA
Yuan Shen Tsinghua University, China
David Shuman Franklin W. Olin College of Engineering, USA
Foad Sohrabi Nokia Bell Labs, USA
Charles Soussen Paris-Saclay University, France
Cihan Tepedelenlioglu Arizona State University, USA
Hoi To Wai The Chinese University of Hong Kong, China
Meng Wang Rensselaer Polytechnic Institute, USA
Yue Wang Georgia State University, USA
Herwig Wendt University of Toulouse, France
Zai Yang Xi’an Jiaotong University, China
Wei Yi University of Electronic Science and Technology of China (UESTC), China
Feng Yin The Chinese University of Hong Kong, China
Tatsuya Yokota Nagoya Institute of Technology, Japan
Shaofeng Zou University of Buffalo, USA

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